Supported Targeted Reference Designs

Targeted Reference Designs (TRDs)	ISE	Vivado	Description
Artix™-7 AC701 Base TRD		2013.1	Gen2 x4 PCIe® to DDR3 subsystem with an NWL DMA - 10 Gbps performance
Kintex™-7 KC705 Base TRD	14.4	2013.1	Gen2 x4 PCIe to DDR3 subsystem with an NWL DMA - 10 Gbps performance
Kintex-7 DSP TRD	13.4	2013.1	High-speed analog LVDS interface with DUC/DDC - Filters overclocked at 491.75 MHZ
Kintex-7 Embedded TRD	14.5	2013.1	MicroBlaze embedded system with AXI DDR3 Mem - AXI DDR3 memory interface
Kintex-7 Connectivity TRD	14.4	2013.1	Gen2 x8 PCIe to DDR3 subsystem with a NWL DMA - 20 Gbps performance
Zynq™-7000 ZC702 Base TRD	14.5	2013.1	Video example with hardware acceleration - Pattern generator to HDMI output
Zynq-7000 ZVIK TRD with Video	14.5	2013.1	Video example with hardware acceleration - HDMI in to HDMI out
Zynq-7000 ZC706 TRD	14.5	2013.1	Gen2 x4 PCEe to Processor Subsystem with NWL DMA - Video example with hardware acceleration
AMS TRD	14.5	2013.1	National Instruments LabVIEW interface used to perform measurements on XADCs built into the 7 Series FPGA and Zynq SoC devices Supports FFT analysis, decimation, linearity and internal voltage and temperature tests The AMS Reference Design uses the AMS101 Evaluation Card and the AMS Evaluator tool (built on National Instruments LabVIEW) to perform measurements on the 1 mega-sample per second (MSPS), 12-bit Xilinx analog-to-digital converters (XADCs) built into the 7 series FPGAs and Zynq SoC.  The reference design supports Fast Fourier Transform (FFT) analysis, decimation, linearity tests and measures internal voltage and temperature.