Support|documentation

  Xcell Journal Online
  Xcell Journal Article
  Partner Yellow Pages
   
  Xcell Archives
  Order Free Xcell Journal
  Comments & Suggestions
  Write Articles for Xcell

    

Home : Documentation : Xcell Journal Online : Article
Interfacing SMA Connectors to Virtex-II Pro MGTs



by Warren Miller, VP of Marketing, Avnet
warren.miller@avnet.com

Vince Gavagan, Design Engineer, Avnet
vince.gavagan@avnet.com  (3/18/04)

SMA connector choice has a surprising effect on signal integrity.

article link to PDF
Article PDF 466 KB


While designing the Avnet Design Services Virtex-II Pro™ 3.125 Gbps Aurora Design Kit, we found that there were a variety of options for the interface between the Virtex-II Pro multi-gigabit transceivers (MGTs) and the SubMiniature version A (SMA) connectors on the board. After trying a few of these options and measuring the results on the prototype board, we discovered that the signal integrity performance of the interface varied widely depending on the type of SMA connector used, the location, and characteristics of the board traces.

In this article, we’ll review several specific design options and their impact on signal integrity. Our test results will show why the final “optimal” design was selected. We’ll also provide detailed measurements on the signal integrity of the final design.

Avnet Virtex-II Pro Aurora Design Kit
The Aurora Design Kit includes the Avnet Design Services Virtex-II Pro evaluation board and its associated documentation, board support package, applications code, and example designs. The Aurora reference design has been ported to the board; an example design communicating between serial ports at 3.125 Gbps demonstrates the features and capabilities of the design kit. The circuit board used in the design kit is shown in Figure 1.

The hardware features of the evaluation board include the user FPGA, on-board memory, on-board communications, expansion, and configuration. A complete block diagram of the board’s hardware components is shown in Figure 2.

The user FPGA is a Virtex-II Pro XC2VP7-FF896 device that includes an embedded PowerPC™ processor, eight high-speed serial I/O channels, and RocketIO™ MGTs.

The high-speed communications functions of the board include eight SMA connectors (TX/RX pairs for two RocketIO ports) with board-configurable loop-back for two RocketIO transceivers and pads for four additional RocketIO ports.

The connectors featured on board include two 140-pin general-purpose I/O expansion connectors (AvBus), up to 30 LVDS pairs, and a standard 50-pin 0.1-inch header for custom expansion.

Memory includes Micron™ DDR SDRAM (64 MB) for use as code storage space for the PowerPC and packet storage for serial I/O ports. Communication can also occur over a standard RS-232 serial port for simple monitor or debug functions.

An included 5.0V AC/DC power supply provides up to 22.5W for the on-board Texas Instruments™ 3.3V 6A module and National Semiconductor™ linear regulators. You can configure the FPGA via two Xilinx XC18V04-VQ44 PROMs, a Parallel IV cable for JTAG, and fly-wire support for Parallel-III and Multilinx™ configuration cables.

Mictor™ connectors are available to access the remaining high-speed I/O signals (MGTs) on the device for test or characterization.

Prototype Design
When we first received the prototype design from the manufacturing house, we tested the MGT-to-SMA connections. In preliminary testing, we used a loop-back connection over an SMA cable from one MGT to another. No FR4 of significant length was inserted.

Test packets were simple 00 to FF data words (256 bytes) with idle sequences (k28.5, d21.4, d21.5, d21.5) between packets. We captured eye diagrams using the repeating idle sequence (Figure 3). Although the eye opening is fairly clean, the pattern is a repeating idle sequence and thus doesn’t provide a very extensive test. During our initial prototype testing, we sent several thousand packets successfully. However, testing additional boards revealed that performance was not repeatable, and in fact was much worse for the majority of boards. Because these initial boards used -5 speed grade parts, we surmised that the errors could be attributed to the 2.0 Gbps limitation of the -5 speed grade devices.

Yet procurement of -6 speed grade parts revealed that this was not the case; a substantial number of errors continued to occur. Because the design includes two RocketIOs that are looped back via FR4 on the board in addition to the SMA breakout, we repeated the test using the non-SMA loop-back. These tests yielded substantially better results. In fact, the non- SMA loop-back was capable of 3.125 Gbps with identical payload and zero errors. During these tests, we performed Time Domain Reflectometry (TDR) on the board as well, with results shown in Figure 4. After reviewing these results, we concluded that although the board impedance was matched very well, a severe impedance mismatch existed at the SMA connectors.

This information suggested we should look more closely at the layout, and we determined that during the design phase, a stub was overlooked. As the FPGA and SMAs both reside on the top (component) side of the PCB, and the traces are also on layer one (a 100 Ohm differential impedance micro-strip), a stub is created at the through-hole SMA.

Prior to a board spin, two boards were used to test the theory. Testing unmodified boards with 15 inches of FR4 (using an FR4 characterization board) yielded the following results:

Board #1:
 # of packets # byte errors
Test 1 0x10000 (65,536) 136
Test 2 0x10000 (65,536) 306

Board #2:
 # of packets # byte errors
Test 1 0x10000 (65,536) 5527
Test 2 0x10000 (65,536) 8270

We modified the poorer performing board by cutting the through-hole stub protruding from the backside of the board and grinding the stub flush with the backside of the board.

With stubs cut, we observed the following results:

Board #2:
 # of packets # byte errors
Test 1 0x10000 (65,536) 168
Test 2 0x10000 (65,536) 273

With stubs filed flush, we obtained the following results:

Board #2:
 # of packets # byte errors
Test 1 0x10000 (65,536) 115
Test 2 0x10000 (65,536) 134

This seemed to be a promising approach, so we decided to try another option to eliminate the stub before doing a re-layout of the board. The SMAs were removed from board #2 and placed on the backside of the board. This effectively removed the stub, since the via and center SMA conductor became part of the intended transmission line.

Testing this modified board yielded zero errors. This confirmed our finding that the stub was the cause of the unacceptable error rate and that a layout change was required to remove the stub. Because we wanted to keep the SMAs on the top side and minimize modification to the existing microstrip, a board spin was required. Noting the performance of surface-mount SMAs in simulation, we decided to proceed with a similar SMA configuration for the board spin.

Revision of the Prototype Design
The prototype board was redesigned to eliminate the stub by using a surface-mount SMA connector. More extensive testing would also be necessary to further verify the operation of the new board design.

In addition to FR4 characterization, we chose to use a more exhaustive test pattern to validate the performance of the new board. Furthermore, partial reconfiguration would allow on-the-fly adjustments to MGT parameters such as pre-emphasis and differential swing. The results are shown in Figure 5.

The test setup parameters were:

  • MGT 4 connected through a 12-inch RG 316 cable (Johnson 415-0029-012) to a 20-inch FR4 trace on the Xilinx MGT characterization board (Xilinx)
  • Pre-emphasis at 25% (setting 2 of 0-3) and differential swing of 600 mV (setting 2 of 0-4)
  • Test pattern is PRBS32 (using the Xilinx BERT design)
  • MGT 6 connected through 24-inch RG316 (manufacturer unknown) to 15-inch FR4 characterization board (Xilinx)
  • Pre-emphasis at 25% (setting 2 of 0-3) and differential swing of 600 mV (setting 2 of 0-4).
  • Test pattern is PRBS32.
We ran the test until the 16550 UART timed out (an evaluation-licensed core); the total frames are shown in Figure 6. Note that there are no errors; hence the bit error rate is zero. Also, the error factor is defined on page nine and table 2 in Xilinx Application Note XAPP661 as the shortest gap between errors, expressed in frames. Because there are no errors, it makes sense that this would be infinite.

The final TDR test results are shown in Figure 7. A careful reading of the results shows a 50% improvement over the previous reading and confirms the improvement of the new design.

Conclusion
During the design phase, you must be very careful to identify all sources of trace and stub length. In particular, watch for a mismatch between your choice for throughhole or surface-mount SMA devices and the layout of your traces between the SMA connector and the Virtex-II Pro FPGA. We found it was easy to control the length and impedance of the traces, but we overlooked the impact SMA connector choice had on the signal integrity.

Detailed design files and test measurements are available with the purchase of an Avnet Design Services Virtex-II Pro 3.125 Gbps Aurora Design Kit. You can order the kit, part number ADS-XLX-V2PROEVLP7-6, for $599.

This design kit is just one of many available to speed the development cycle for complex processor, communications, FPGA, DSP, and networking applications. All of our design kits are modular and can accept matching add-on modules, applications software, design and debug tools, and compatible IP cores. For more information, visit www.avnetavenue.com.

Printable PDF version of this article with graphics. PDF logo (3/18/04) 466 KB

 
/csi/footer.htm