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More designers are determining the requirements
and completing the design of power distribution
networks (PDN) for FPGAs and CPUs in the frequency
domain. Although the ultimate goal is to
keep the time-domain voltage fluctuation (noise)
on the PDN under a pre-determined maximum
level, the transient noise current that creates the
noise fluctuations may have many independent and
highly uncertain components, which in a complex
system are hard to predict or measure.
Figure 1 is a simple sketch of a PDN [1]
with two test points. In the frequency
domain, you can describe this network
with a two-by-two impedance matrix,
where the indices refer to the test points.
Z11 and Z22 are the self impedances at test
points 1 and 2, respectively, and Z12 and
Z21 are the transfer impedances between
test points 1 and 2.
With very few exceptions, the PDN
components are electrically reciprocal;
therefore the two transfer impedances are
identical, and can be replaced with a mutual
impedance term:
Z12 = Z21 = ZM.
You cannot assume electrical symmetry,
however, so Z11 and Z22 are, in general,
different. You can calculate the noise
voltages at test points 1 and 2 generated
by the noise currents of I1(t) and I2(t) of
the two active devices with the following
formula:
V1(t) = Z11I1(t) + ZMI2(t)
V2(t) = ZMI1(t) + Z22I2(t)
A PDN comprises power sources
(DC/DC, AC/DC converters, batteries);
low- and medium-frequency bypass capacitors;
PCB planes or other metal structures
(a collection of traces or patches); packages
with their PDN components; and the
PDN elements of the silicon [2]. When
dealing with board-level PDN, its impedance
contributions to the overall PDN performance
are much more stable and predictable, so much so that we
often forget to analyze our PDN
designs against component tolerances.
In this article, we’ll show
how tolerances of bypass-capacitor
parameters, such as capacitance
(C), effective series resistance
(ESR), effective series inductance
(ESL), and capacitor location
impact the impedance of PDNs.
C, ESR, and ESL Tolerance Effects
Figure 2 shows the simple equivalent circuit
of a bypass capacitor when neglecting
the parallel leakage of the capacitor. The
series capacitor-resistor-inductor circuit
shows a resonance frequency with a given
quality factor (Q). You can calculate the
series resonance frequency (SRF) and Q
from the equations below:
Although in a general case all three elements
in the equivalent circuit are frequency-dependent [3], for the sake of simplicity,
and because it would not change the conclusions
of this article, we’ll use frequencyindependent
constant parameters.
Figure 3 shows the impedance magnitudes
of three different capacitors you could use in a PDN. Each curve has a label,
giving the C, ESR, and ESL values
assumed for the part. The SRF and Q values
are also shown for each part. With these
numbers, the 100 µF part could be a tantalum
brick; the 1 µF and 0.1 µF parts could
be multi-layer ceramic capacitors (MLCC).
When connecting capacitors with different
SRFs in parallel, they may create
anti-resonance peaks where the impedance
magnitude exceeds the lower boundary of
the composing capacitors’ impedance magnitude
values [4] [5]. The impedance
penalty gets bigger as the Q of capacitors
gets bigger, or as their SRFs are farther
apart in frequency.
The anti-resonance peaks get even bigger
when you consider the possible tolerances
associated with the capacitor
parameters. We illustrate this in Figure 4,
which shows what happens in typical, best,
and worst cases when you connect the three
capacitors from Figure 3 in parallel. The
plot assumes no connection impedance or
delay between the capacitors. You can use
this assumption as long as the distance
between the capacitors is much less than
the wavelength of higher frequency of
interest, and the connecting series plane
impedance is much less than the impedance
of capacitors.
The frequency plot extends up to 100 MHz, which represents a wavelength of 15
meters in FR4 PCB dielectrics. This tells us
that the lumped approximation is valid in
this entire frequency range, no matter
where we place these capacitors on a typical-size PCB.
Table 1 lists the percentage tolerance
ranges for the C, ESR, and ESL values
used in Figure 3. We calculated the
impedance curves and tolerance analysis
with a simple spreadsheet [6]. The spreadsheet
calculates the complex impedance
resulting from the three parallel connected
impedances. During tolerance analysis,
the spreadsheet steps each parameter systematically
though their minimum and
maximum values – specified by the tolerance
percentage entered – and accumulates
the lowest and highest magnitudes at
each frequency point.
Table 1 – Parameters used for Figure 4
| | C1 | tol. [%] | | C2 | tol. [%] | | C3 | tol. [%] |
| Capacitance [uF]: | 100 | 20 | | 1 | 20 | | 0.1 | 20 |
| | -20 | | | -20 | | | -20 |
| ESR [ohms]: | 0.1 | 0 | | 0.02 | 0 | | 0.05 | 0 |
| | -50 | | | -50 | | | -50 |
| ESL [nH]: | 10 | 25 | | 3 | 25 | | 0.8 | 25 |
| | -25 | | | -25 | | | -25 |
For Figure 4, we assume a
capacitance tolerance of ±20%
for all three capacitors. For ESR,
datasheets usually state the maximum
value but no minimum,
so we can assume a +0 to -50%
tolerance around the nominal
value. ESL strongly depends on
both the capacitor’s construction
and its mounting geometry.
For this example, we assume
±25% inductance variation.
Figure 4 also shows the impedance magnitudes
of the individual capacitors with
thin lines. The three heavy lines in the figure
represent the maximum, typical, and
minimum values from all possible tolerance
permutations. All three curves exhibit two
peaks: the first around 1 MHz and a second
around 10 MHz.
The trace representing the typical case
has an impedance magnitude of 0.11
Ohms and 0.24 Ohms at these peak frequencies,
respectively. Impedance at and
around the first peak is mostly below the
impedance curves of the 100 µF and 1 µF
capacitors. The second peak, however,
exceeds the lower boundary of the impedance
curves of the 1 µF and 0.1 µF capacitors
by about a factor of two. This is a
typical anti-resonance scenario.
In a worst-case combination of component
tolerances, the second anti-resonance
peak increases from 0.24 Ohms to 0.77
Ohms, a 220% increase. The contributors
to the second anti-resonance peak are the
ESR and ESL of the 1 µF capacitor, and the
C and ESR of the 0.1 µF capacitor. The sum
of the tolerances of these four parameters is
145%, but they increase the impedance at
the peak by 220%. This illustrates that the
resonance magnifies the tolerance window.
Bypass Capacitor Range
Bypass capacitors are considered to be
charge reservoir components, and common
wisdom tells you to put them close to the
active device they need to feed. We will
show here that when the capacitor and the
active device are connected with planes, the
ratio of plane impedance and ESR of
capacitor will determine the spatial gradient
of impedance around the capacitor.
Even at low frequencies, the impedance
gradient can be significant.
Let’s look at the self-impedance distribution
over a 2” x 2” plane pair with 50 mil
plane separation. You will get this plane
separation if you have just a few layers in
the board and if they are not placed next to
each other in the stack-up. The characteristic
impedance of these planes is approximately
1.7 Ohms. You can calculate the
approximate plane impedance from our
third equation [7]:
where Zp is the approximate plane impedance
in Ohms and h and P are the plane
separation and plane periphery, respectively,
in the same but arbitrary units.
We assume one piece of capacitor located
in the middle of the
planes. MLCC capacitors
are available with as much
as a few hundred µF
capacitance in the 1210
case style, and their ESR
can be as low as one milliohm.
For this example,
we use C = 100 µF, ESR = 0.001 Ohm, ESL = 1 nH. The SRF of this part is 0.5 MHz.
The surface plot of Figure 5 shows the
variation of self-impedance magnitude
over the plane at 0.5 MHz. The gray bottom
area of the graph represents the top
view of the planes. The grid on the bottom
area shows the locations where the
impedance was calculated: the granularity
was 0.2 inches. The logarithmic vertical
scale shows the impedance magnitude
between 1 and 10 milliohms.
We calculated the surface impedance
with a spreadsheet [8]. The
macro in the spreadsheet calculates
the impedance matrix by evaluating
the double series of cavity resonances.
It then combines the complex
impedance of plane pair with
the complex impedance of the
bypass capacitor.
The impedance surface at 0.5
MHz has a sharp minimum in the
middle; here the capacitor forces its
ESR value over the plane impedance.
However, as we move away
from the capacitor, the impedance
rises very sharply. At 0.2 inches away,
the impedance is approximately
50% higher; 0.4 inches away, the
impedance magnitude doubles. At
the corners of the 2” x 2” plane pair,
the impedance magnitude is almost
10 milliohms.
When changing either the plane
impedance or the ESR of capacitor
so that their values are closer, the
variation of impedance over the
plane shape gets smaller. Figure 6
shows the impedance surface of the
same plane shape and same capacitor
in the middle, except we
increased ESR from 1 to 7 milliohms
and decreased the plane separation
from 50 to 20 mils. Now
the impedance surface at SRF varies
only about 10% over the plane area.
For Figures 5 and 6, you can see
the same characteristic behavior if
you sweep the frequency over a wider
frequency range in the spreadsheet.
The impedance surface of Figure 5
changes and fluctuates significantly,
while the impedance surface of
Figure 6 changes less with frequency.
Note that this trend does not change if
we have more capacitors on the board. If
we have significantly different plane
impedance and cumulative ESR of capacitors,
the impedance gradient will be big,
and we must use many capacitors to hold
the impedance uniformly down over a
bigger area even at low frequencies.
Conclusion
The impedance tolerance window at the
anti-resonance peak of paralleled discrete
bypass capacitors widens with higher Q
capacitors. To keep the impedance window
due to tolerances small, you need either
many different SRF values tightly spaced
on the frequency axis, or the Qs of capacitors
must be low.
Contrary to popular belief, the service
range of low-ESR capacitors is
severely limited when connected to
planes of much higher impedance. But
you can achieve the lowest spatial
impedance gradient if the cumulative
ESR of bypass capacitors is close to the
characteristic impedance of planes.
References
[1] Novak, I. “Frequency-Domain Power-
Distribution Measurements – An Overview,
Part I” in HP-TF2, Measurement of Power
Distribution Networks and their Elements.
DesignCon East, June 23, 2003, Boston.
[2] Smith, L.D., R.E. Anderson, D.W.
Forehand, T.J. Pelc, and T. Roy. 1999. Power
Distribution System Methodology and
Capacitor Selection for Modern CMOS
Technology. IEEE Transactions on Advanced
Packaging 22(3): 284-290.
[3] Novak, I., and J. R. Miller. “Frequency-
Dependent Characterization of Bulk and
Ceramic Bypass Capacitors” in Proceedings of
EPEP, October 2003, Princeton, NJ.
[4] Brooks, Douglas. 2003. Signal Integrity
Issues and Printed Circuit Board Design.
Upper Saddle River: Prentice Hall.
[5] Ritchey, Lee W. 2003. Right the First Time,
A Practical Handbook on High Speed PCB
and System Design, Volume 1. Glen Ellen:
Speeding Edge.
[6] Download Microsoft™ Excel spreadsheet
at http://home.att.net/~istvan.novak/tools/bypass49.xls
[7] Novak, I., L. Noujeim, V. St. Cyr, N.
Biunno, A. Patel, G. Korony, and A. Ritter.
2002. Distributed Matched Bypasssing for
Board-Level Power Distribution Networks.
IEEE Transactions on Advanced Packaging
25(2):230-243.
[8] Download Microsoft Excel spreadsheet at
http://home.att.net/~istvan.novak/tools/Caprange_rev10.xls
Printable PDF version of this article with graphics. (3/29/04) 426 KB |