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A few months ago, I needed a few new hard
drives: two desktop drives for home and a
bigger 120 GB drive for my laptop, which
was out of space. Browsing through a
Seattle-area computer store, I compared
the prices of Ultra ATA drives (older, parallel
architectures) and Serial ATA (SATA)
disk drives, discovering that the higher
throughput of the SATA drives had resulted
in price points that were twice those of
the Ultra ATA drives. To me, this presented
a crisp picture of the economic drivers
behind the SERDES technology wave:
higher throughput commanding a higher
price, yet lower manufacturing costs.
You would think hardware designers
would be making a mad dash toward serial
design. However, I find that the “dash”
toward SERDES seems to hover around
20 percent. Pondering this, I have come to
believe that there are three primary reasons
for the reticence among the remaining
80 percent:
- Speed. Many applications are not
pushing the speed envelope.
- Resistance to change. Even innovative
engineers are creatures of habit.
3
- Real or perceived technical hurdles.
SERDES design requires a different
approach than wide, parallel bus
design.
In this article, I’ll address the third reason
in detail. Although my focus is on
Xilinx® Virtex™-II Pro RocketIO™ technology,
the information would apply to
any serial interface, including RocketIO
transceivers in Virtex-4 devices.
Line Loss
An ideal lossless transmission line assumes
that a signal propagates down the line with
no energy loss. In other words, if a 1.0V
signal with a 1.0 ns rise time enters one end
of the line, the same 1.0V and 1.0 ns signal
will come out the far end.
This is a good approximation when signal
rise times are on the order of 1.0 ns (or
slower), and with trace lengths of 10 in (or
shorter). However, as rise times trend
toward 100 ps and lengths get significantly
longer (as in a backplane), the lossy effects
of transmission lines begin to influence signal
quality dramatically. As Figure 1 shows,
these effects – both attenuation and risetime
degradation – vary directly with
length at higher frequencies.
To describe and accurately predict the
behavior of real interconnects, two important
mechanisms that absorb energy from
the signal must be modeled:
- Resistive loss. From DC through frequencies
up to a few megahertz, the
current in a trace moves through the
entire cross-sectional area of the trace.
At higher frequencies, however, current
flows along the perimeter of a line
rather than uniformly across the entire cross-section. As a result, the series
resistance of the signal and return path
conductors increases with the square
root of frequency as the effective crosssection
of the interconnect path is
reduced. Resistive loss is also referred
to as “skin effect.” But no matter what
you call it, it is the same phenomenon,
and something you should be concerned
about at high frequencies.
- Dielectric loss. The second important
loss mechanism is dielectric loss, which
is simply the conversion of electrical
energy from the alternating electric field
into heat. Dielectric loss, often specified
in decibels per meter, increases with frequency
and varies inversely with a material’s
“loss tangent” – a function of the
material’s resin type and molecular
structure. Depending on resin content,
“vanilla” FR-4 has a loss tangent ranging
from 0.02-0.03. Lower loss tangent
equates to more of the output signal
getting to its destination, as well as
higher material costs compared to FR-4.
GETEK, for example, has a loss tangent
of 0.012. Nelco 4000-13 is 0.01. And
the loss tangent for Rogers 4003 is as
low as 0.0027. For an actual design, you
will want to discuss the tradeoffs with
your board vendor.
Loss, Jitter, and ISI
I’ve often heard engineers use
the terms inter-symbol interference
(ISI), jitter, and loss
to refer to the same thing: the
unknown cause of a less-than-optimal signal or bitstream.
In fact, these are
different phenomena.
Random jitter is used to
describe random events that
result in a delay between the
expected and actual signal
transition. The distribution of
random effects follows a classic
Gaussian distribution, where
the results vary wider (in time)
as more data is observed. This
data is typically provided by
the driver manufacturer.
Deterministic jitter encompasses the
list of systematic interconnect effects that
will reoccur if you repeat the same stimulus.
Dielectric and resistive loss, as well as
crosstalk, reflections, via parasitics, returnpath
discontinuities, and any systematic
aspect of an interconnect design contribute
to deterministic jitter.
If the combined effects of random and
deterministic jitter are significant enough,
ISI will result, indicating that bit distinctions
have become “blurry” at the receiver.
This becomes particularly serious
when rise-time degradation becomes
comparable to the bit period of the signal.
As a result, the shape of the received
waveform will depend on the prior bit
pattern (ISI).
These effects are best modeled using
an oscilloscope that supports eye diagram
analysis. Eye diagrams provide a visual
display of the signal quality over many bit
transitions with both deterministic and
random jitter serving to close the “eye.”
At a glance, an eye diagram will show
if an interconnect is acceptable. Pass/fail
criteria are often specified by an eye mask,
shown as a blue hexagon on the left-hand
side of Figure 2. Eye masks, which conform
to the various SERDES specifications,
define minimum and maximum
keep-out regions where proper bit transitions
should not appear for proper receiver
interpretation of the driver’s intent.
Typically used bit patterns, or “pulse
trains,” include 8b/10b encoding and
PRBS (pseudo-random bit stimulus). The
8b/10b data transmission scheme is considered
ideal for high-speed local area networks
and computer links. Realistic, long
character sequences eventually hit some
kind of worst-case history, but this can
take a long time. A PRBS stimulus, as
shown on the right-hand side of Figure 2,
provides a means to force as much “action”
on a serial data path as possible, in the
smallest number of cycles. It is “pseudorandom”
because it actually repeats after a
pre-determined “n” number of bits.
Losing Less from Lossy Lines
Assuming that you have followed good
routing rules (for example, achieving a consistent
differential impedance of 100 ohms
and avoiding excessive routing skew), there
are five major ways to mitigate loss:
- Reduce resistive loss by widening
traces. Because resistive loss or “skin
effects” are the result of a reduced
cross-sectional area in a trace, wider
traces result in a larger cross-sectional
area, so the percent reduction due to
resistive loss becomes smaller.
- Reduce dielectric loss by shortening
lines. Dielectric loss is a function of
the material used and the length
over which a signal is transmitted.
Shortening the overall interconnect
length (which may not be possible
in many systems) can be an effective
means of eliminating loss.
- Reduce dielectric loss by employing
lower loss tangent dielectrics. To
reduce dielectric loss, more expensive
materials – with lower loss tangents –
can be considered, perhaps after
exhausting less-expensive approaches.
- Increase driver pre-emphasis. Boost
the initial voltage level of each edge
to compensate for high-frequency
loss. (The trade-off here is additional
power consumption.)
- Equalization at the receiver. The
incoming signal’s lower frequency
components are intentionally attenuated
to artificially balance between
high- and low-frequency components.
The result is then amplified,
with equalization of the low- and
high-frequency signal components.
Although it is possible to estimate risetime
degradation and loss based on rules
of thumb, the only way to get a realistic
prediction of the impact from losses is to
use a software simulator with the capability
of simulating lossy lines. The
HyperLynx Virtex-II Pro RocketIO
Design Kit, along with HyperLynx simulation
software, will enable you to simulate
the preceding effects with Xilinx
RocketIO technology.
The HyperLynx RocketIO Design Kit
In an effort to make multi-gigabit interconnect
implementation as painless as possible,
Xilinx and Mentor Graphics have
teamed up to provide the RocketIO Design
Kit for HyperLynx. Editable, pre-configured
circuits in the kit are ready to simulate
for both chip-to-chip applications and
PCB backplanes – including connectors
and pre-configured differential striplines.
The FR-4 traces used are a differential
pair of centered striplines, 12 mils wide
and 20 mils apart, with a 50 ohm characteristic
impedance.
Figure 2 shows simulation results for
the Xilinx backplane example with a 36 in
transmission path and four vias. The eye in
the figure shows encroachment on the
XAUI (10 Gb Extended Attachment Unit
Interface) eye mask when using 10 percent
pre-emphasis. Here, we can clearly see the
effects of ISI at the receiver.
Although you could engage any of the
five primary loss-reduction mechanisms
to open up the eye, let’s assume that the
36 in backplane is a design requirement
and that the four vias
are inevitable. One of
the remaining options
is pre-emphasis, which
can be bumped up to
20, 25, or 33 percent.
Figure 3 shows the
results at 25 percent
pre-emphasis: the eye
is wide open, which is
great. With the wide
margin around the
XAUI mask’s internal
keep-out region, I
would want to simulate
this again at 20
percent pre-emphasis
in an attempt to conserve
power.
Conclusion
Although I simulated only one solution
here, any permutation of the five ways to
deal with loss is possible. Moreover, you
could also examine non-ideal routing
effects, including simulation of the
impacts of differential length skew. With
the availability of helpful simulation tools
like HyperLynx, you don’t need to fabricate
prototypes – wondering whether
you’ve over-designed or under-designed,
spent too much or spent too little.
In a future extension of this theme,
we’ll revisit the Xilinx SIS Kit backplane
design and examine the impact of the
new equalization technology in the
Virtex-4 implementation of RocketIO
transceivers.
The HyperLynx RocketIO Design
Kit is available from www.mentor.com/hyperlynx.
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