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AR# 17830

Spartan Devices - Reliability information for Spartan devices


Where can I find information on reliability and failures in time (FIT) for Spartan FPGAs?


The Xilinx Reliability group publishes a quarterly report to monitor reliability data for each device. This report is available at:


The failure rate is typically defined in unit of FIT (Failures In Time). One FIT means one failure per one billion device hours.

NOTE: Reliability measurements are only performed on production material.

AR# 17830
Date Created 09/03/2007
Last Updated 12/15/2012
Status Active
Type General Article