Defect Detection Accelerated Application

The Defect Detection accelerated app is a machine vision application that automates detection of defects, maturity of products (e.g., fruits, PCBs), and sorting in high-speed factory pipelines by using computer vision library functions.

Defect Detection Accelerated Application Block Diagram

Features:

  • Low latency defection  at 2MP​
  • Defect detection and sorting of fruits​
  • HDMI our DIsplayPort out​
  • User programmable CV models ​
  • Complete application including HW design
Frequently Asked Questions

No, the app does not require any experience in FPGA design.

This application is free of charge from Xilinx.

No, the application has been optimized and tested for OnSemi’s AR0144. To adapt the application for another sensor, you will have to update the design and optimize the application for the new sensor.

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