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  1. Xilinx - Adaptable Intelligence
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  3. AR# 35943: 12.1/11.x - SVF - Erase fails on 28F128P30 BPI flash

AR# 35943

12.1/11.x - SVF - Erase fails on 28F128P30 BPI flash

Description

When programming a 28F128P30 BPI flash in SVF mode I see the following failure in iMPACT -

ScanDR 1024 TDI(0000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000
0000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000
000000000000000000000000000000000000000000000000000A0) TDO(000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000
0000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000
000000000000000000000000000000000008000) Mask(000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000
0000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000
00000000000000000000000000000000000E300) Smask()
ERROR:iMPACT - On line 845133,Failed ScanDR: TDO 0000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000
0000000000000000000000000000000000000000000000000000000000000000000000071570000000000000000000000000000000500
000000000100000000000011020001a08a0059 does not match Expected TDO(000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000
0000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000000
000000000000000000000000000000000008000)
EXCEPTION:iMPACT:SVFReader.c:376:1.30 - Scan Data Mismatch.

How do I work around this issue?

Solution

This issue is with the wait time in the SVF. The wait time specified is the max required by the Data Sheet. Increasing this time works around the issue by exceeding the specified wait time. To do this search for the expected TDO and increase the RUNTEST from RUNTEST 872000000 TCK to RUNTEST 1000000000 TCK.

Example

Original

// Loading device with 'JTAG_CMD_REG'command.
// Currently the maximum wait time is used as suggested by manufacturer.
// For better performance, edit the following wait time as needed.
RUNTEST 872000000 TCK;

Modified

// Loading device with 'JTAG_CMD_REG'command.
// Currently the maximum wait time is used as suggested by manufacturer.
// For better performance, edit the following wait time as needed.
RUNTEST 1000000000 TCK;

Linked Answer Records

Master Answer Records

Answer Number Answer Title Version Found Version Resolved
35448 12.x iMPACT - Known Issues N/A N/A
AR# 35943
Date 12/15/2012
Status Active
Type General Article
Devices
  • Virtex-5 FXT
  • Virtex-5 LX
  • Virtex-5 LXT
  • More
  • Virtex-5 SXT
  • Virtex-5 TXT
  • Virtex-5Q
  • Virtex-6 CXT
  • Virtex-6 HXT
  • Virtex-6 LX
  • Virtex-6 LXT
  • Virtex-6 SXT
  • Spartan/XL
  • Spartan-6 LX
  • Spartan-6 LXT
  • Less
Tools
  • ISE Design Suite - 11.1
  • ISE Design Suite - 11.2
  • ISE Design Suite - 11.3
  • More
  • ISE Design Suite - 11.4
  • ISE Design Suite - 11.5
  • ISE Design Suite - 12.1
  • Less
Boards & Kits
  • Platform Cable USB
  • Platform Cable USB-II

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